Patent · US Expired

Method of forming a thin film of copper

US5817367A · kind A · utility

11Cited by
7References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 23, 1996
Grant dateOct 6, 1998
Priority date
Expiry dateDec 23, 2016

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/18
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method of forming a thin film of copper on a substrate includes a first step of conducting a chemical vapor deposition (CVD) process using a metal organic (MO) source while applying a first bias voltage to the surface of the substrate and a second step of conducting a chemical vapor deposition process using a metal organic source while applying a second bias voltage to the substrate, wherein the second bias voltage is opposite in polarity to the first bias voltage. The process may include a third step of conducting a chemical vapor deposition process using a metal organic source while applying a third bias voltage to the substrate, where the third bias voltage has the same polarity as the first bias voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.