Rapid non-invasive optical analysis using broad bandpass spectral processing
US5818048A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 3, 1994 |
| Grant date | Oct 6, 1998 |
| Priority date | — |
| Expiry date | Nov 3, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/3137
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a generally applicable apparatus and method for achieving measurements of a constituent in a sample. This is achieved by employing a detection means having a plurality of detectors responsive to radiation in a selected region of the spectrum, e.g., the infrared. In most embodiments, at least two of the detectors provide broad wavelength bandpass. If narrow bandpass sources or detectors are used, the information generated is processed in a manner similar to broadband information. The broad bandpass response of the detectors can be contrasted with the approach of classical spectrophotometry, in which the spectral response of the detectors is designed to be as narrow as feasible, and substantially narrower than the spectral features of the constituent or constituents of interest. The data is processed such that the contributions of known background constituents and scattering is eliminated prior to further processing, thereby yielding a better result in high background situations. The use of intensity processing rather than absorbance processing also allows the method and apparatus to be used in a variety of non-ideal situations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.