Patent · US Expired

High-density, highly reliable integrated circuit assembly

US5818108A · kind A · utility

0Cited by
6References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 14, 1997
Grant dateOct 6, 1998
Priority date
Expiry dateApr 14, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3025
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention concerns an MCM type high-density assembly of integrated circuits having a high reliability by virtue of its design and the means employed in its implementation. The essential feature of the assembly is the presence of one or more interconnection substrates in addition to at least one substrate carrying a plurality of unencapsulated electronic chips connected to the interconnection substrate(s) by conventional microwiring techniques, preferably through one or more apertures in the substrates. The interconnection substrate(s) is or are advantageously of the multilayer type. The assembly is adapted to be encapsulated thereafter in a hermetically sealed case in the manner that is standard for MCM. In various embodiments the unencapsulated chips can be attached to one or both sides of a supporting substrate, respectively in conjunction with the use of one or two interconnection substrates with apertures; a plurality of sets of two or three substrates formed in this way can be stacked either in one case or in separate cases designed to be stacked; the integrated circuits can be conventional two-dimensional chips or "3D" blocks of circuits integrated in three dimensions. Th…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.