Simultaneous multisample analysis and apparatus therefor
US5818580A · kind A · utility
43Cited by
2References
27Claims
0Family size
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Inventor
Key dates
| Filing date | Mar 12, 1996 |
| Grant date | Oct 6, 1998 |
| Priority date | — |
| Expiry date | Mar 12, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6402
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Analytical apparatus and methods for processing multiple samples simultaneously. Radiation such as laser light desirably including plural wavelengths is directed through multiple samples simultaneously, as by directing a beam of radiation along a single path through all of the samples. Response to each wavelength is monitored by monitoring an induced effect, other than the intensity of the applied radiation itself. Useful signal-to-noise ratios are obtained with low absorption in each sample. One sample desirably is of known composition, and serves as an internal calibration standard.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.