Method for testing the authenticity of a data carrier having an integrated circuit
US5818738A · kind A · utility
60Cited by
7References
62Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 30, 1989 |
| Grant date | Oct 6, 1998 |
| Priority date | — |
| Expiry date | Jun 30, 2009 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2209/56
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for testing the authenticity of data carriers having integrated circuits, memory and logic means to determine physical properties of each circuit that are distinctive of this circuit and use them to obtain data characteristic of each circuit. According to the present invention, one preferably evaluates the different programming times of the memory cells of an E.sup.2 PROM memory, an evaluation which can be determined by various methods and processed as distinctive characteristics. Other individual properties that can be utilized are, for example, distinctive features of a memory input.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.