Patent · US Expired

Uncooled amorphous YBaCuO thin film infrared detector

US5821598A · kind A · utility

7Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 21, 1996
Grant dateOct 13, 1998
Priority date
Expiry dateJun 21, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N19/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A thermal detector includes a transducer layer of semiconducting yttrium barium copper oxide which is sensitive at room temperature to radiation and provides detection of infrared radiation. In a gate-insulated transistor embodiment, a layer of ferroelectric semiconducting yttrium barium copper oxide forms a gate insulator layer and increases capacitance of the transistor or latches the transistor according to the polarization direction of the ferroelectric layer. The transducer layer may be formed as an amorphous semiconductor and deposited at room temperature by simple sputtering. The sensitive element can be incorporated into a thermal isolation structure as part of an integrated circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.