Spectrometry apparatus
US5822061A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 8, 1996 |
| Grant date | Oct 13, 1998 |
| Priority date | — |
| Expiry date | Nov 8, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/42
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The spectrometry apparatus of the present invention includes, in addition to conventional analysis, a first diaphragm having a first chosen variable aperture for spatially filtering a coherent-excitation beam. The apparatus also includes a first deflector stage (DF1) for sweeping an excitation beam over a sample according to a first chosen deflection. Additionally, there is included a second diaphragm having a second variable aperture conjugate with the first aperture for filtering the incoherent-scattering beam. The spectrometry apparatus further provides a second deflector stage placed downstream in order to sweep the spectral image of the incoherent-scattering beam thus filtered over the multichannel detection module according to a second chosen deflection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.