Systems, methods and computer program products for prediction of defect-related failures in integrated circuits
US5822218A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 27, 1996 |
| Grant date | Oct 13, 1998 |
| Priority date | — |
| Expiry date | Aug 27, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31835
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods and computer program products for predicting defect-related failures in integrated circuits produced by an integrated circuit fabrication process identify objects in a circuit layout for the integrated circuit design, each object having a location in the circuit layout and a reliability connectivity in the integrated circuit design. Sample object defects are generated for the identified objects, each sample object defect representing a defect produced in an object by the integrated circuit fabrication process and having a defect magnitude associated therewith. An accelerated life defect influence model is identified for each sample object defect, relating the lifetime of an object to the defect magnitude of a defect in the object. Sample object lifetimes are generated from the defect magnitudes associated with the sample object defects according to the corresponding identified accelerated life defect influence models. A prediction of the reliability of integrated circuits is generated from the sample object lifetimes according to the reliability connectivity of the associated objects in the integrated circuit design. Preferably, the accelerated life defect influenc…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.