Patent · US Expired

Method and apparatus for determining analytical data concerning the inside of a scattering matrix

US5825488A · kind A · utility

246Cited by
8References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 8, 1996
Grant dateOct 20, 1998
Priority date
Expiry dateNov 8, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/49
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and an apparatus for determining analytical data concerning the inside of a scattering matrix, in particular of a biological sample. In a detection step detection measurements are carried out in which light is irradiated into the matrix as primary light at an irradiation site (12) through an interface bounding the scattering matrix (6) and light emerging out of the scattering matrix through the interface is detected as secondary light at a detection site (13) at a predetermined measuring distance from the irradiation site, in order to determine as a measurement variable a measurable physical property of the light which varies due to the interaction of the light with the scattering matrix, which measurement variable is a measure of the analytical data to be determined. In an evaluation step the analytical data are determined on the basis of the measurement variable measured in the detection step. In order that such a matrix analysis may be carried out with relatively simple measuring means, at least two detection measurements are carried out in the detection step with different reflection conditions at the interface (5) between the irradiation site (12) and the detection si…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.