Spectral measuring apparatus and automatic analyzer
US5828450A · kind A · utility
38Cited by
6References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 17, 1996 |
| Grant date | Oct 27, 1998 |
| Priority date | — |
| Expiry date | Jul 17, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In order to make a Raman spectral measuring apparatus effective for measurement of a vital sample and attain miniaturization and weight reduction, a near infrared laser diode is employed as a light source, and a spectroscope for receiving Raman scattered light from the sample is formed by a polychrometer comprising a concave diffraction grating and a multichannel photodiode array. The Raman scattered light incident through an inlet slit is separated into its spectral components by the diffraction grating, and its spectra are simultaneously detected by the photodiode array over a prescribed wavelength region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.