Apparatus and method for scanning laser microscopy
US5828459A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 28, 1997 |
| Grant date | Oct 27, 1998 |
| Priority date | — |
| Expiry date | Apr 28, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining the fine structure of materials by means of a nonlinear scanning laser microscope, including the steps of forming an image of a specimen by scanning selected points thereof with a focusable laser beam of a predetermined fundamental frequency w, thereby exciting the points to generate signals constituting the third harmonic 3w of said fundamental frequency w, collecting the signals by collecting means, substantially filtering out from the collected 3w signals, signals of a frequency other than the third harmonic 3w, feeding the filtered 3w signals to a detector, and storing the output of the detector for processing and display. A nonlinear scanning laser microscope adapted to form an image of a specimen by scanning it point by point with a focusable laser beam of a predetermined fundamental frequency, is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.