Patent · US Expired

Methods and apparatus for electrically verifying a functional unit contained within an integrated cirucuit

US5831991A · kind A · utility

6Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 13, 1996
Grant dateNov 3, 1998
Priority date
Expiry dateDec 13, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318547
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatus for electrically verifying a functional unit contained within an integrated circuit comprises a functional unit, a state machine, a number of integrated circuit input pins, and means for alternately providing the functional unit with control data derived from the state machine, and control data derived from the number of integrated circuit input pins. The means for providing control data from alternating sources comprises a multiplexor which receives a first set of inputs from the state machine, and a second set of inputs from a test control block. The test control block monitors various of the integrated circuit input pins for a designated instruction, receives control data via the input pins, and controls the operation of the multiplexor. The test control block comprises a number of test registers which can be configured to receive two or more states of control data. An additional multiplexor, internal to the test control block, may then be used to sequentially provide successive states of "test" control data to the functional unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.