Method of detecting defects in materials using infrared thermography
US5834661A · kind A · utility
31Cited by
3References
3Claims
0Family size
Assignee
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Key dates
| Filing date | Nov 12, 1996 |
| Grant date | Nov 10, 1998 |
| Priority date | — |
| Expiry date | Nov 12, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of detecting defects in materials using infrared thermography, includes placing the rear surface of an object to be inspected close to the front surface of a thermoplate controlled by a temperature controller, and the front surface of the object in a vacuum chamber. At the other end of the vacuum chamber, on the outside, an infrared camera is arranged facing the object, so that a vacuum is maintained between the object and the camera. Defects are detected from thermal images of the object, obtained with the infrared camera.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.