Patent · US Expired

Test probe guide device

US5834929A · kind A · utility

5Cited by
10References
1Claims
0Family size

Inventor

Key dates

Filing dateAug 14, 1997
Grant dateNov 10, 1998
Priority date—
Expiry dateAug 14, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/06788
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test probe guide device 10 for use with a conventional electrical test probe 100 and an electrical wire 200 wherein the guide device 10 includes a housing member 20 dimensioned to receive the test probe 100 and spring biased plunger disk 30 and further including a wire engaging unit 13 comprising a hook member 40 dimensioned to captively engage the electrical wire 200 to allow the test probe needle 102 to be electrically connected to the electrical wire 200.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.