Patent · US Expired

Triple modulation experiment for a fourier transform spectrometer

US5835213A · kind A · utility

11Cited by
1References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 13, 1996
Grant dateNov 10, 1998
Priority date
Expiry dateSep 13, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2003/2866
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

For a step-scanning Fourier transform spectrometer comprising an interferometer, a detector, and a digital signal processor (DSP), a method for measuring a response of a sample to multiple modulations is disclosed. In one embodiment, the method comprises the steps of utilizing the DSP to measure a phase modulation angle and a sample modulation angle; obtain an interferogram that corresponds to a calibrated static sample response by using the measured phase modulation rotation angle; obtain another interferogram which corresponds to the calibrated dynamic sample response by using both the measured phase and sample modulation rotation angles; and computing one or more spectra from the interferograms which indicates the calibrated response of said sample to the multiple modulations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.