Patent · US Expired

Method of controlling a short-etalon fabry-perot interferometer used in an NDIR mearsurement apparatus

US5835216A · kind A · utility

21Cited by
3References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 5, 1996
Grant dateNov 10, 1998
Priority date
Expiry dateJul 5, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/3504
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of controlling a short-etalon Fabry-Perot interferometer used in an NDIR measurement apparatus includes generating a measurement signal using a radiant source. The measurement signal is provided to a sample point containing a gas mixture to be measured. The measurement signal is bandpass-filtered with an electrically tuneable Fabry-Perot interferometer using at least two wavelengths of the interferometer passband. The measurement signal is passed via an optical filter component prior to detection, and the filtered measurement signal is detected by a detector. During the measurement cycle, the passband frequency of the interferometer is controlled to coincide at least partially with the cutoff wavelength range of the optical filter component.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.