Patent · US Expired

Method and apparatus for measuring gas concentrations and isotope ratios in gases

US5838008A · kind A · utility

53Cited by
5References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 1996
Grant dateNov 17, 1998
Priority date
Expiry dateDec 18, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/3595
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of determining a trace gas concentration in a gas sample utilizing Fourier Transform Infrared Spectroscopy. The method includes the steps of PA1 (i) synthetically calibrating a spectrometer, and PA1 (ii) determining a spectral window within which to fit a calculated spectral trace to an experimental spectral trace by PA2 (a) choosing a series of candidate windows; PA2 (b) determining the likely error measure associated with a fitting of the spectral trace for each of the series of candidate windows; PA2 (c) utilizing the likely error measure associated with each of the fitting to determine a final window having substantially the lowest likely error measure; and PA2 (d) utilizing the final window as the spectral window. The calibration and the spectral window is then utilized to fit a calculated spectral trace to a spectral trace measured by the spectrometer and to determine the concentrations of constituent gases.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.