Optoelectronic spectral analysis system
US5838451A · kind A · utility
64Cited by
6References
24Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 15, 1996 |
| Grant date | Nov 17, 1998 |
| Priority date | — |
| Expiry date | Aug 15, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Improved apparatus for low cost measurement of spectral intensity distribution of light energy reflected from surfaces of or transmitted through objects or materials, using solid state emitters and detectors. The measurement results remain consistent in spite of variations in component characteristics or temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.