Processor apparatus and method for a process measurement signal
US5841666A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 1995 |
| Grant date | Nov 24, 1998 |
| Priority date | — |
| Expiry date | Dec 21, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01F23/284
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for processing a time domain reflectometry (TDR) signal to generate an output result corresponding to a valid process variable. The method includes the steps of processing the TDR signal using at least two different techniques for detecting a valid reflection pulse generated by the process variable to calculate an independent result using each of the at least two techniques, and applying a weighted factor to the independent results from each of the at least two different techniques to provide weighted output results. The method also includes the steps of comparing the weighted output results, and selecting the valid output result from the weighted output results based on the comparing step. In the illustrated method, the comparing step includes the step of summing the weighted factors for each independent result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.