Testing of memory content
US5841786A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 13, 1997 |
| Grant date | Nov 24, 1998 |
| Priority date | — |
| Expiry date | Jan 13, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of testing a memory associated with a microprocessor, particularly for use in smart cards. The method involves comparing the output from the memory (2) passed along a read path (10) with predetermined data signals generated externally and passed via a port (7) along a read path (9). Comparison is carried out in a comparison device (3) which may, for example, be the microprocessor, suitably programmed. The output form the comparison device (3) is a simple pass/fail verification signal applied to a port (5). The stored data held in memory (2) may be permanently held data such as in a ROM, or (where the memory is alterable) may be specially written to the memory for the purpose of the text.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.