Patent · US Expired

Method for fabricating a semiconductor wafer

US5849636A · kind A · utility

8Cited by
7References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 12, 1996
Grant dateDec 15, 1998
Priority date
Expiry dateDec 12, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/974
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method processes a semiconductor wafer by etching the wafer, which has been smoothed by rough lapping, with alkaline solution. A rod is sliced into a plurality of wafers. The peripheral edges of the wafers are chamfered. The processed strain layers over the wafers due to chamfering are smoothed and planarized. The processed strain layers are then removed by etching with alkaline solution. The etched wafers are mirror polished. Lastly, the mirror-polished wafers are cleaned.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.