Abnormnal pattern detecting or judging apparatus, circular pattern judging apparatus, and image finding apparatus
US5850465A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 1991 |
| Grant date | Dec 15, 1998 |
| Priority date | — |
| Expiry date | Aug 28, 2011 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S128/92
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An abnormal pattern detecting apparatus comprises a device for finding prospective abnormal patterns in a radiation image of an object from an image signal representing the radiation image, and a device for finding anatomical information about the object from the image signal. From the image signal components of the image signal, which represent the image information at positions in the vicinity of each prospective abnormal pattern, a characteristic measure calculating device calculates a plurality of characteristic measures for each prospective abnormal pattern. An abnormal pattern finding device utilizes the characteristic measures and the anatomical information in order to find a true abnormal pattern from the prospective abnormal patterns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.