Patent · US Expired

Method for testing the authenticity of a data carrier

US5850524A · kind A · utility

2Cited by
2References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 1996
Grant dateDec 15, 1998
Priority date
Expiry dateJul 15, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/00014
  • WIPO fieldIT methods for management
  • WIPO sectorElectrical engineering

Abstract

A method for testing the authenticity of a data carrier having at least an integrated circuit with memory units and logic units as well as a data line for data exchange with an external device. The invention is characterized in that the integrated circuit additionally has a separate hard-wired circuit for transmitting and/or receiving data during the power-up sequence, which is used for authenticity testing, the first transmission or reception of data being completed within a defined time domain of the power-up sequence in which the data line has no defined state.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.