Patent · US Expired

Method and apparatus for testing a magnetic head during manufacture utilizing an internal magnetic field

US5854554A · kind A · utility

28Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 1996
Grant dateDec 29, 1998
Priority date
Expiry dateOct 17, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/09
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for testing a magnetic head provided with at least one MR transducer. The method includes a step of applying a sense current varying with respect to time to the MR transducer element via input/output terminals of the MR transducer element, and a step of measuring a terminal voltage across the input/output terminals of the MR transducer element to check varying resistance characteristics of the MR transducer element with respect to the variation of the applied sense current.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.