Patent · US Expired

Optical system with test/calibration

US5859429A · kind A · utility

7Cited by
21References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 20, 1997
Grant dateJan 12, 1999
Priority date
Expiry dateAug 20, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/6439
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Optical systems are provided. In one embodiment, the optical system includes a detector for detecting a light signal. A light signal gatherer and guider is optically connected with the detector for gathering the light signal and guiding the light signal to the detector. The light signal gatherer and guider has a check signal entrance location disposed along an outer surface of the light signal gatherer and guider. A check signal source is optically connected with the light signal gatherer and guider so that a check signal generated by the check signal source randomly illuminates the check signal entrance location on the outer surface of the light signal gatherer and guider.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.