Patent · US Expired

Method of and measuring arrangement for metal detection with a coil device having several separately controllable regions

US5859532A · kind A · utility

5Cited by
3References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 1, 1995
Grant dateJan 12, 1999
Priority date
Expiry dateNov 1, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V3/104
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a method and a measuring device for metal detection with the use of a coil arrangement the spatially offset transmitting coils are controlled with pulse sequences of different pulse patterns. The receiving coils associated with the transmitting coils are scanned with respect to the received measuring signals with a scan pattern corresponding to the respective associated pulse pattern. It is therefore possible to control simultaneously all transmitting coils and to provide a spatial determination of a metal object located in a throughgoing region of a gate frame.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.