System for determining size and location of defects in material by use of microwave radiation
US5859535A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Feb 12, 1997 |
| Grant date | Jan 12, 1999 |
| Priority date | — |
| Expiry date | Feb 12, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N22/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Microwave radiation emitted from a single antenna is focused on a targeted material from which reflected radiation is received by the same antenna to provide signal measurement data from which detected material defects are evaluated by determination of void location and size. Antenna position and orientation is adjusted to obtain the signal measurement data from of the microwave radiation reflection along at least two target incidence paths from the same target location, one of which is normal to said targeted surface of the material and the other oblique thereto at a scattering angle at which the signal radiation intensity is minimized.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.