Non-volatile circuit that disables failed devices
US5859803A · kind A · utility
2Cited by
6References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 8, 1997 |
| Grant date | Jan 12, 1999 |
| Priority date | — |
| Expiry date | Sep 8, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention discloses a circuit for controlling operation of a functional circuit in a device based on a test result during testing. The circuit comprises a first storage element configured to be in one of a first state and a second state according to the test result, and a first sensing element coupled to the first storage element for generating a first signal used to control the operation of the functional circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.