Patent · US Expired

Method of and device for the quantitative detection of material in a sample

US5861629A · kind A · utility

0Cited by
5References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 18, 1996
Grant dateJan 19, 1999
Priority date
Expiry dateJun 18, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/222
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method of quantitatively detecting material in a sample, whereby the material is in the form of submicrometric particles covered by a photoemitting substance, and a device for practicing the method. The material in the sample is heated to a photoemitting state and subjected while in that state to photoemission measurement. The proportion of material in the sample is determined from the signal obtained from that measurement by comparison with empirical data obtained from a reference sample containing a previously detected quantity of the material or by comparison with data obtained for the material by calibration.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.