Patent · US Expired

Etching method and process for producing a semiconductor element using said etching method

US5863412A · kind A · utility

49Cited by
6References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 1996
Grant dateJan 26, 1999
Priority date
Expiry dateOct 17, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P70/50
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method for etching an object having a portion to be etched on the surface thereof, comprising a step of immersing said object in an electrolyte solution such that said object serves as a negative electrode; a step of arranging a counter electrode having a pattern corresponding to a desired etching pattern to be formed at said portion to be etched of said object in said electrolyte solution so as to maintain a predetermined interval between said counter electrode and said object, and a step of applying a direct current or a pulse current between said object and said counter electrode to etch said portion to be etched of said object into a pattern corresponding to said pattern of said counter electrode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.