Patent · US Expired

Electron Microscope

US5864138A · kind A · utility

15Cited by
6References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 12, 1996
Grant dateJan 26, 1999
Priority date
Expiry dateSep 12, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/0216
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The electron microscope provides sufficient leg space for an observer sitting in a chair in a working posture and allows concentrated observation and swift operation of the electron microscope without burdening the observer. An electron gun column is supported on a support structure formed in a rectangular parallelepiped. The electron gun column, a column evacuation device and a viewing chamber are mounted on the dampers on the support structure through a vibration plate. The table is mounted on the support structure through table supports provided on the top surface of the support structure. Further, the table has an opening at a location corresponding to the viewing chamber so that the table and the viewing chamber, both mounted on the support structure, are not in contact with each other. The layout of the operation panel divides the operation devices of the electron microscope into a group of devices that are frequently reached by touch and operated during observation and a group of devices that are not frequently used during observation. The former group is arranged in arc areas within reach of the operator's arms when pivoted about the elbows as the operator rests his arms na…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.