Patent · US Expired

Analytical method and device for precise analysis with a simple sensor

US5866321A · kind A · utility

42Cited by
1References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 25, 1996
Grant dateFeb 2, 1999
Priority date
Expiry dateOct 25, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/5438
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An analyte and a reactant 3 that reacts with the analyte either directly or indirectly are allowed to react with each other on the analytical areas A of a substrate 1 and signals originating from the reaction are detected. In at least a signal detection step, either a signal generation-related portion 4x or a detector is provided in a portion that is opposed to the substrate 1 and high and low areas are formed in either the substrate 1 or the opposed portion or both in such a manner that the distance from each analytical area A of the substrate to the opposed portion is shorter than the distance from each of the non-analytical areas B of the substrate to the opposed portion, whereby signals originating from the reaction in the analytical areas A will be detected at higher intensities than signals originating from the reaction in the non-analytical areas B. The analyte can be quantitatively or qualitatively analyzed on the analytical areas of the substrate in high precision with reduced effects from the non-analytical areas of the substrate. Simultaneous analysis of multiple samples or simultaneous analysis for multiple items can also be accomplished with a simple sensor configurati…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.