Patent · US Expired

Cantilevers for a magnetically driven atomic force microscope

US5866805A · kind A · utility

26Cited by

125References

25Claims

0Family size

Assignee

Molecular Imaging Corporation Arizona Board of Regents · US

Inventors

Wenhai Han · Tempe, US
Stuart Lindsay · Tempe, US
Tianwei Jing · Tempe, US

Key dates

Filing date	Sep 12, 1996
Grant date	Feb 2, 1999
Priority date	—
Expiry date	Sep 12, 2016

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S977/875
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A force sensing cantilever for use in a scanning probe microscope has both a top side and a bottom side. From the bottom side extends a probe tip. The bottom side is coated with a thin film of a first material and the top side is coated with a thin film of a second material. The first and second materials may be the same or they may be different. The materials and thicknesses of the respective films are selected so as to create opposing forces to counter the tendency of such cantilevers to bend when a thin film is applied to only one side thereof.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.