Patent · US Expired

Interferometric device for detection

US5867267A · kind A · utility

2Cited by
1References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 17, 1997
Grant dateFeb 2, 1999
Priority date
Expiry dateJul 17, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/45
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The device comprises a parallel input microguide (2) and output microguide (5) between which a flat guide is arranged forming a transition zone (10). Coupling between the flat guide and the microguides is achieved by an optical tunnel effect. The transition zone comprises at least two zones, a reference zone (10a) and an interaction zone (10b). The interaction zone (10b) is formed by depositing a superstrate whose optical coefficient, or thickness, is sensitive to the medium to be studied. The light beam transmitted by the input microguide to the flat guide is divided into a reference beam passing through the reference zone (10a) and a measurement beam passing through the interaction zone (10b). The measurement and reference beams interfere in the output microguide (5). Depending on the geometrical shape of the reference and interaction zones, the device constitutes a double wave or a multiple wave interferometer. Such a device is used to achieve sensors for applications in physics, chemistry and biology.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.