Patent · US Expired

Method for fabricating dielectric device

US5868948A · kind A · utility

11Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 1, 1996
Grant dateFeb 9, 1999
Priority date
Expiry dateOct 1, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N15/10
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating a dielectric device including a capacitor, a pyroelectric infrared detector, and the like is disclosed. The method comprises the steps of etching a dielectric substance film formed on a substrate to form a predetermined pattern with an etchant comprised of hydrofluoric acid and an oxidizing agent, and removing residues resulting from the etching by treating the etched layer with a first treating solution containing a reducing agent and subsequently with a second treating solution containing an acid.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.