Patent · US Expired

Measuring method and measuring apparatus by light scattering

US5870188A · kind A · utility

21Cited by
14References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 19, 1996
Grant dateFeb 9, 1999
Priority date
Expiry dateSep 19, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J3/4412
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An excitation beam from a laser is passed through a bandpass filter, and applied to a sample by a collimator lens. An optical adjusting part comprising a camera lens and a converging lens is provided for receiving scattered light from the sample, so that the camera lens receives the scattered light and converts the same to a parallel beam. The converging lens has chromatic aberration, and receives and converges the parallel beam from the camera lens. An inlet slit of a spectroscope is provided as an inlet port on a converging position by the converging lens. This inlet slit is a circular hole having a diameter of about 200 .mu.m. The inlet slit is arranged on a position for converging anti-Stokes-Raman scattered light through the chromatic aberration of the converging lens.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.