Method for testing the intactness of stored data in a processing facility for sheet material such as bank notes or papers of value
US5870469A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 13, 1997 |
| Grant date | Feb 9, 1999 |
| Priority date | — |
| Expiry date | Feb 13, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/602
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
For testing the intactness of stored data, intact data corresponding to the data to be tested from a component of the processing facility in a certain operating state of the processing facility in the intact state are first stored in a test device. To check the intactness of the data to be tested in a component a key is produced in the test device for each test, said key being different from those of prior tests. Using this key and a cryptographic algorithm one prepares two cryptograms. One cryptogram is prepared from the data to be tested by the component of the processing facility in which the data to be tested are stored. The other cryptogram is prepared from the intact data by the test device. After that the two cryptograms are compared with each other. If the cryptograms match, the data to be tested match the intact data and thus have no undesirable changes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.