Patent · US Expired

Synchronized analyte testing system

US5872713A · kind A · utility

423Cited by
75References
39Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 1997
Grant dateFeb 16, 1999
Priority date
Expiry dateOct 30, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S435/817
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An analyte detection system is provided with calibration information uniquely specific to the set of test strips to which the sample is to be applied. The calibration information may be stored in permanent memory of the testing device, such that the device is discarded after use of all the test strips in a kit, or it may be stored in a calibration chip accompanying the set of test strips and distributed therewith, thereby enabling re-use of the testing device with a different set of test strips and associated calibration chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.