Patent · US Expired

Semiconductor devices

US5880483A · kind A · utility

5Cited by
7References
9Claims
0Family size

Inventors

Key dates

Filing dateFeb 23, 1993
Grant dateMar 9, 1999
Priority date
Expiry dateFeb 23, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02315
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A field effect transistor having a substrate supporting an active layer comprising a Group III-V material. The active layer has a dopant concentration with a source electrode and a drain electrode disposed over and with a gate electrode disposed between the source and drain electrodes in Schottky barrier contact to the active layer. A surface layer portion of the active layer has a negatively charged surface potential disposed between the drain and gate electrodes comprised of said Group III-V material and oxygen. The surface layer portion has a thickness in the range of 25 .ANG. to 35 .ANG.. A layer of passivation material is disposed at least on the surface layer portion of the active layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.