Examining a diamond
US5880504A · kind A · utility
7Cited by
2References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 6, 1997 |
| Grant date | Mar 9, 1999 |
| Priority date | — |
| Expiry date | Jun 6, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/87
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In order to test whether a diamond has had a layer of synthetic diamond deposited thereon, the surface area of the natural part of the stone is measured by measuring the radiant-flux density of radiation substantially of wavelength 230 nm to 320 nm in an integrating sphere containing the diamond. This is compared to the total surface area of the diamond.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.