Spectrometer
US5880833A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 28, 1997 |
| Grant date | Mar 9, 1999 |
| Priority date | — |
| Expiry date | Oct 28, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical spectrum measuring apparatus is disclosed which is able to accurately measure the optical spectrum without an influence and to measure the light intensity per unit frequency without an influence of the change of the bandwidth of the wavelength because of the measured wavelength. The diffraction grating 4 emits the diffracted light with an appropriate wavelength corresponding to the incident angle after diffracting the parallel light. The outgoing light slit 6 passes the diffracted light with a length shorter than the slit width. The AD converter 9 measures the intensity of the diffracted light passed through the outgoing light slit 6. CPU 12 controls the incident angle and the width of the slit. The memory of the bandwidth of the wavelength 14 stores the bandwidth of the passed wavelength and the measured light intensity is adjusted with the bandwidth of the passed wavelength. Also the bandwidth of the passed wavelength is converted to the frequency and the measured light intensity is adjusted by the bandwidth of passed wave frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.