Dual mode coating thickness measuring probe for determining the thickness of a coating on ferrous and non-ferrous substrates
US5886522A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 3, 1996 |
| Grant date | Mar 23, 1999 |
| Priority date | — |
| Expiry date | Oct 3, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dual-mode coating thickness measuring probe for determining the thickness of a coating on ferrous and non-ferrous substrates. The probe has a first winding assembly including an induction winding and two search or pick-up windings and a second winding assembly including a search winding disposed on a non-magnetic and non-conductive former. A magnetic cylindrical pin of a material with a high resistance to impact and abrasive wear passes through the first and second windings. A conductive non-magnetic coaxial screen through which the pin extends separates the first winding from the second winding. The position of the screen is such that it has a minimal effect on the second winding while shielding its field from the first winding. The first and second windings are connected to signal conditioning circuitry which produces outputs representing the coating thickness measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.