Optical spectrum analyzer and process for analyzing the corresponding spectrum
US5886785A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 2, 1997 |
| Grant date | Mar 23, 1999 |
| Priority date | — |
| Expiry date | Oct 2, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an optical spectrum analyzer of an incident light beam (101) and a process for analyzing the corresponding spectrum. The spectrum analyzer comprises addressing means (1), a diffraction grating (2), a reflecting dihedron (3), a device (4) for adjusting the rotation of the reflecting dihedron and reception means (5). A polarization separator (11) divides the incident beam (101) into a first and second parallel secondary beam (102, 104), of linearly polarized light along the directions parallel to and perpendicular to the grooves in the grating respectively, and a .lambda./2 plate (12) placed on the path of the first secondary beam (102) applies a perpendicular polarization direction to this beam. The grating diffracts the secondary beams (103, 104) a first time, the reflecting dihedron exchanges their directions, the grating diffracts them a second time, the .lambda./2 plate applies a 90.degree. rotation to the polarization state of the second secondary beam (110) and the separator recombines the secondary beams (109, 111) into a single main beam (112) returned to reception means.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.