Patent · US Expired

Optical surface testing means for linearly moving, tape-like materials

US5886789A · kind A · utility

1Cited by

9References

11Claims

0Family size

Assignee

Emtec Magnetics GmbH · DE

Inventors

Albrecht Koller · Munich, DE
Bernd Scholtysik · Munich, DE

Key dates

Filing date	Feb 20, 1997
Grant date	Mar 23, 1999
Priority date	—
Expiry date	Feb 20, 2017

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/8921
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A surface testing device, operating by reflection, for linearly moving, tape-like materials, for example paper or polymer films, is suitable for automatic online registration of linear irregularities transverse to the direction of movement. The testing device includes a suitable test distance, at least two optical inspection units and at least one electronic circuit arrangement for detecting both the individual signals of the inspection units and the coincidence signals. In addition, a magnetic information medium wound in the form of a roll on a hub is tested by the surface testing device and carries a machine-readable and/or visually readable quality identification.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.