Integrated accelerometer test system
US5895858A · kind A · utility
14Cited by
3References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 10, 1997 |
| Grant date | Apr 20, 1999 |
| Priority date | — |
| Expiry date | Mar 10, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M7/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic and integrated mechanical and electrical accelerometer test system including a test fixture for holding the accelerometers to be mechanically and electrically tested; a handler subsystem for automatically feeding the accelerometers to the test fixture; a shaker subsystem for mechanically testing the accelerometers, the shaker subsystem linked to the test fixture, the shaker subsystem automatically vibrating the test fixture; and a tester for electrically testing the accelerometers while the accelerometers are vibrating.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.