Vibrometer
US5897494A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 1997 |
| Grant date | Apr 27, 1999 |
| Priority date | — |
| Expiry date | Jan 31, 2017 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2505/05
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A vibrometer which detects the variation of the speckle interference pattern of reflected waves as a means of determining the amplitude and frequency of vibrations of structures, including small anatomical structures. A wave source such as a laser delivers wave radiation to the object whose vibration is to be measured. The diffuse reflectance from the textural surface of the object reflects the incident wave radiation as a speckle interference pattern which is detected by a detector, such as a photodetector. The wave radiation source may be a continuous-wave laser, and the photodetector detector may be a phototransistor connected to a wide-bandwidth amplifier. As the object vibrates, the speckle interference pattern moves. The variation in the speckle interference pattern across the detector carries amplitude and frequency information regarding the vibrating object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.