Integrated circuit test socket with enhanced noise imminity
US5899755A · kind A · utility
29Cited by
4References
25Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 12, 1997 |
| Grant date | May 4, 1999 |
| Priority date | — |
| Expiry date | Mar 12, 2017 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K7/1069
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An interconnecting device for electrically interconnecting a number of device terminals to a number of board terminals. The interconnecting device includes a housing which has a number of contact receiving slots wherein each slot receives one of a number of contacts. A shielding layer is provided to enhance noise immunity by shielding each contact against electromagnetic interference (EMI). The shielding layer absorbs stray radiated EMI from each one of the number of contacts and dissipates the absorbed energy as thermal energy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.