Near-field scanning microwave microscope having a transmission line with an open end
US5900618A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 26, 1997 |
| Grant date | May 4, 1999 |
| Priority date | — |
| Expiry date | Aug 26, 2017 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/862
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
The microscope includes a microwave generator connected to a mismatched transmission line which terminates in a probe with an exposed end. When a sample is brought into close proximity with the exposed end of the probe, the frequencies and quality factors of the standing wave resonances on the transmission line between the source and the probe are modified. The microwave signal reflected from the end of the probe varies as the capacitance between the probe and the sample changes and as the conductivity of the sample changes. Scanning the sample relative to the probe allows generation of an image from the variation of the reflected signal. Alternatively, to image a device with the microscope, a microwave signal is applied to the device, the probe is scanned over the device, and the signal that is picked up is recorded. In a second embodiment, a first lock-in amplifier is used to lock in the microscope at the resonant frequency, and a second lock-in amplifier is used to detect a curvature of the resonance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.