Patent · US Expired

X-ray examination apparatus with a semiconductor x-ray detector

US5905772A · kind A · utility

33Cited by

4References

24Claims

0Family size

Assignee

U.S. Philips Corporation · US

Inventors

Walter Rutten · Linnich, DE
Ulrich Schiebel · Aachen, DE
Herfried Karl Wieczorek · Aachen, DE
Norbert Conrads · Raeren, BE

Key dates

Filing date	Jul 8, 1997
Grant date	May 18, 1999
Priority date	—
Expiry date	Jul 8, 2017

Classification

Technology area (CPC H)Electricity
CPC primaryH01J2231/50036
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

An x-ray examination apparatus includes an x-ray source for emitting x-rays and an x-ray detector for deriving an image signal from an x-ray image. The x-ray detector has a semiconductor element including one or several sensor elements. Further the x-ray examination apparatus is provided with a bias radiation source for irradiating the x-ray detector with electromagnetic radiation. In particular, the x-ray detector is an x-ray sensor matrix having a multitude of semiconductor sensor elements. Preferably the bias radiation source is arranged to emit infrared radiation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.