System and method for performing tensile stress-strain and fatigue tests
US5907102A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 15, 1997 |
| Grant date | May 25, 1999 |
| Priority date | — |
| Expiry date | Apr 15, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/58
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A stress-strain test for conductors. A test assembly receives first and second conductive layers and a dielectric layer adjacent each of the conductive layers. The layers are generally ring-shaped and concentric when received by the test assembly and the dielectric layer separates the conductive layers from each other. A magnetic field source provides a magnetic field to the test assembly and a variable current source provides current to the second conductive layer. A circuit measures a change in capacitance between the conductive layers when the current in the second conductive layer is varied whereby the stress and strain characteristics of the second conductive layer are determined as a function of the capacitance change.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.